Wyniki wyszukiwania
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 758 - 762
IEEE Electron Device Letters > 2017 > 38 > 2 > 164 - 167
IEEE Journal of the Electron Devices Society > 2016 > 4 > 4 > 174 - 178
IEEE Electron Device Letters > 2016 > 37 > 3 > 284 - 286
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 319 - 325
2011 International Reliability Physics Symposium > 6B.4.1 - 6B.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 236 - 243
2010 International Electron Devices Meeting > 5.3.1 - 5.3.4
2010 International Electron Devices Meeting > 36.6.1 - 36.6.4
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2699 - 2705