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In safety critical applications precise characterization of circuits to predict the lifetime reliability is a key challenge. This paper proposes a reliability assessment tool to model and simulate the NBTI degradation including its recovery effect during the design phase of digital circuits. The model is based on single device models and the corresponding measurement data. The circuits under test...
Device aging, which causes significant loss on circuit performance and lifetime, has been a main factor in reliability degradation of nanoscale designs. Aggressive technology scaling trends, such as thinner gate oxide without proportional downscaling of supply voltage, necessitate an aging-aware analysis and optimization flow in the early design stages. Since PMOS sleep transistors in power-gated...
Aging, which can be regarded as a time-dependent variability, has until recently not received much attention in the field of electronic design automation. This is changing because increasing reliability costs threaten the continued scaling of ICs. We investigate the impact of aging effects on single combinatorial gates and present methods that help to reduce the reliability costs by accurately analyzing...
In this paper we present a design for reliability methodology, with the goal of reducing the impact of transistor VTH degradation due for example to phenomena such as NBTI. It uses infrastructure IPs (I-IPs) featuring a self compensation scheme that automatically detects transistor aging effects and illustrates the design for test infrastructure used to make the SoC/System aware of the NBTI effects...
The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
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