Serwis Infona wykorzystuje pliki cookies (ciasteczka). Są to wartości tekstowe, zapamiętywane przez przeglądarkę na urządzeniu użytkownika. Nasz serwis ma dostęp do tych wartości oraz wykorzystuje je do zapamiętania danych dotyczących użytkownika, takich jak np. ustawienia (typu widok ekranu, wybór języka interfejsu), zapamiętanie zalogowania. Korzystanie z serwisu Infona oznacza zgodę na zapis informacji i ich wykorzystanie dla celów korzytania z serwisu. Więcej informacji można znaleźć w Polityce prywatności oraz Regulaminie serwisu. Zamknięcie tego okienka potwierdza zapoznanie się z informacją o plikach cookies, akceptację polityki prywatności i regulaminu oraz sposobu wykorzystywania plików cookies w serwisie. Możesz zmienić ustawienia obsługi cookies w swojej przeglądarce.
We have developed a measurement-based modeling technique employing Keysight's X-parameter methodology for characterizing nonlinear behavior in thin Film Bulk Acoustic (FBAR) piezoelectric resonators and filters. As a pair of continuous wave (CW) tones at frequencies f1 and f2 are incident upon a resonator, a set of vector measurements of the resonator response are performed at each of the integer...
In this contribution, two different approaches to the analysis of nonlinear analog circuits in the frequency domain using scattering variables are examined, the nonlinear scattering parameters (S-parameters) based on the Volterra series and the X-parameters. After the theoretical backgrounds are shortly recapitulated, the benefits and drawbacks of each method are outlined. Both methods are applied...
A novel approach to the modelling of passive intermodulation (PIM) generation in passive components with distributed weak nonlinearities is outlined. Based upon the formalism of X-parameters, it provides a unified framework for co-design of antenna beamforming networks, filters, combiners, phase shifters and other passive and active devices containing nonlinearities at RF front-end. The effects of...
Volterra series representation is a powerful mathematical model for nonlinear devices. However, the difficulties in determining higher-order Volterra kernels limited its broader applications. This paper proposed a systematic approach that enables a convenient extraction of Volterra kernels from X-parameters for the first time. Then the Vandermonde method is employed to separate different orders of...
We report on an alternative application of X-parameters to improve the efficiency of a general TCAD physical device simulator when simulating the response of a RF power transistor to different load impedance harmonic terminations. In particular, we combine large-signal circuit-device simulations with the predictive capability of X-parameters in order to avoid very time-consuming multi-harmonic simulations...
X-parameters have been shown to have a wide array of applications in the modeling of nonlinear devices and systems. This work introduces a process called x2ibis in which X-parameter models are used to generate the I–V and V-t tables used in an Input/Output Buffer Information Specification (IBIS) file. The X-parameter model generation and the conversion of these models to the tables in an IBIS file...
Effective high power microwave amplifier design and system modeling require accurate nonlinear models, which, in turn, require measurement of at least 3 harmonics with NIST traceable phase reference between them. Exceeding a decade of measurement bandwidth at microwave frequencies can be problematic, and a fraction of a dB of calibration error can lead to 10's of percentage points of “disappointment”...
Integrated circuit (IC) models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). The integrated circuit immunity model for conducted immunity (ICIM-CI) of IEC 62433-4 assumes that the IC terminals still behave linearly at injection power levels that cause susceptibility. This hypothesis should be systematically verified when...
In this work, the polyharmonic distortion (PHD) model is used to analyze the behavior of high-speed nonlinear links. The model assumes the validity of the harmonic superposition principle for high-speed I/O links. From the PHD formalism, a frequency-domain X-parameter matrix formulation is derived. The formulation accommodates both port and harmonic dependence of the signals. Relationships are derived...
This paper reviews and contrasts two complementary device modeling approaches based on data readily obtainable from a nonlinear vector network analyzer (NVNA). The first approach extends the application of waveform data to improve the characterization, parameter extraction, and validation methodologies for “compact” transistor models. NVNA data is used to train artificial neural network -based constitutive...
X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This work presents an automated application combining a nonlinear vector network analyzer (NVNA) instrument with automated load-pull measurements that extends the measurement and extraction of X-parameters over the entire Smith Chart. The...
Podaj zakres dat dla filtrowania wyświetlonych wyników. Możesz podać datę początkową, końcową lub obie daty. Daty możesz wpisać ręcznie lub wybrać za pomocą kalendarza.