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Predicting the immunity of printed circuit boards (PCBs) to radiated electromagnetic interference (EMI) requires the computation of the electromagnetic field's coupling to PCB traces. A modified Taylor-based analytical model exists developed and validated for PCB's immunity prediction. In this paper, we present the methodology of development of an electronic design automation (EDA) extension for Altium...
In filter design, inter-component parasitic couplings play a major role in the filter response. Most often, filter designers try to minimize these couplings through a proper implementation of components; conversely, this paper aims to optimize filter responses through a clever use of these couplings. Previous works have been performed to reach such an objective ([1]–[2]), focusing on the study of...
Knowing the frequency dependent complex permittivity of Printed Circuit Board (PCB) substrates is important in modern electronics. In this paper, two methods for measuring the permittivity are applied to the same Flame Resistant (FR4) substrate and the results are compared. The reference measurement is performed by inserting the sample in a rectangular waveguide and measuring the scattering parameters...
Models for field-to-line coupling are interesting because they help to predict the immunity of PCBs and explain the relation between routing and immunity. In this article a meandered PCB trace illuminated by EM field in a TEM cell is analysed. The near-end and far-end coupling is predicted using two models: a detailed and an approximative one. The detailed model is a circuit of coupled multi-conductor...
The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to...
Integrated circuit (IC) models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). The integrated circuit immunity model for conducted immunity (ICIM-CI) of IEC 62433-4 assumes that the IC terminals still behave linearly at injection power levels that cause susceptibility. This hypothesis should be systematically verified when...
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