Search results
IEEE Transactions on Nuclear Science > 2017 > 64 > 3 > 976 - 982
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 511 - 518
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2359 - 2366
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3047 - 3053
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3386 - 3394
IEEE Transactions on Nuclear Science > 2014 > 61 > 1-3 > 630 - 635
Journal of Display Technology > 2013 > 9 > 9 > 729 - 734
IEEE Transactions on Electron Devices > 2013 > 60 > 2 > 699 - 707
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.3.1 - 2B.3.5
IEEE Transactions on Nuclear Science > 2012 > 59 > 2 > 439 - 446
IEEE Electron Device Letters > 2012 > 33 > 6 > 758 - 760
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 76 - 84