Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 37 - 49
IEEE Journal of Solid-State Circuits > 2015 > 50 > 11 > 2475 - 2490
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 9 > 1951 - 1955
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 255 - 261
2013 5th IEEE International Memory Workshop > 132 - 134
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.3.1 - 2B.3.5
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 8 > 2212 - 2221
2008 IEEE Asian Solid-State Circuits Conference > 405 - 408