Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4363 - 4367
IEEE Electron Device Letters > 2017 > 38 > 9 > 1252 - 1255
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4776 - 4784
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 291 - 297
IEEE Electron Device Letters > 2017 > 38 > 5 > 580 - 583
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-9.1 - PM-9.4
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-8.1 - DG-8.5
IEEE Transactions on Nanotechnology > 2017 > 16 > 2 > 281 - 289
IEEE Transactions on Industry Applications > 2017 > 53 > 1 > 251 - 260
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417