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2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-1.1 - 3F-1.6
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
2016 IEEE International Electron Devices Meeting (IEDM) > 9.6.1 - 9.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 14.7.1 - 14.7.4
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 573 - 577
2015 IEEE International Electron Devices Meeting (IEDM) > 19.8.1 - 19.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 32.3.1 - 32.3.4
IEEE Electron Device Letters > 2015 > 36 > 9 > 966 - 968
IEEE Electron Device Letters > 2015 > 36 > 9 > 978 - 980
IEEE Electron Device Letters > 2015 > 36 > 8 > 784 - 786
IEEE Electron Device Letters > 2015 > 36 > 4 > 411 - 413