Wyniki wyszukiwania
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-6.1 - XT-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-2.1 - 4C-2.4
IEEE Electron Device Letters > 2017 > 38 > 4 > 430 - 433
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 183 - 193
2016 IEEE International Reliability Physics Symposium (IRPS) > 2A-2-1 - 2A-2-5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 910 - 915
IEEE Electron Device Letters > 2016 > 37 > 3 > 242 - 244
2015 IEEE International Electron Devices Meeting (IEDM) > 20.5.1 - 20.5.6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.3.1 - 20.3.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.7.1 - 11.7.4