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2015 IEEE International Reliability Physics Symposium > XT.6.1 - XT.6.4
2015 IEEE International Reliability Physics Symposium > 3B.2.1 - 3B.2.6
2015 IEEE International Reliability Physics Symposium > 2F.1.1 - 2F.1.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 408 - 412
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.9.1 - XT.9.4
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1279 - 1281
IEEE Journal of Solid-State Circuits > 2012 > 47 > 5 > 1075 - 1083
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 4 > 1079 - 1085
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1570 - 1574
IEEE Electron Device Letters > 2011 > 32 > 6 > 791 - 793
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 516 - 523