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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 455 - 460
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2391 - 2397
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-5-1 - 4B-5-8
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-1-1 - DI-1-4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 308 - 318
2015 IEEE International Reliability Physics Symposium > PI.1.1 - PI.1.4
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
2013 IEEE International Reliability Physics Symposium (IRPS) > PI.2.1 - PI.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > GD.1.1 - GD.1.4
IEEE Electron Device Letters > 2013 > 34 > 10 > 1289 - 1291
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5