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IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 488 - 493
Electronics Letters > 1993 > 29 > 5 > 472 - 474
Electronics Letters > 1992 > 28 > 19 > 1849 - 1850
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 488 - 493
Electronics Letters > 1993 > 29 > 5 > 472 - 474
Electronics Letters > 1992 > 28 > 19 > 1849 - 1850