Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1467 - 1473
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
IEEE Journal of Solid-State Circuits > 2010 > 45 > 4 > 817 - 829