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IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3312 - 3328
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3081 - 3091
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5114 - 5120
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Electron Device Letters > 2017 > 38 > 12 > 1767 - 1770
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3115 - 3125
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4302 - 4309
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 10 > 2679 - 2690
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1172 - 1176
IEEE Transactions on Power Electronics > 2017 > 32 > 10 > 7845 - 7850
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 9 > 1007 - 1011
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2394 - 2401
IEEE Transactions on Power Electronics > 2017 > 32 > 8 > 6416 - 6433
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 3 > 216 - 226
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 8 > 2063 - 2072
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 7 > 651 - 653
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 6 > 1342 - 1353
IEEE Latin America Transactions > 2017 > 15 > 6 > 1043 - 1051