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IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2893 - 2898
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
2013 Spanish Conference on Electron Devices > 281 - 284
2008 IEEE Custom Integrated Circuits Conference > 511 - 514