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2011 International Reliability Physics Symposium > 3A.5.1 - 3A.5.6
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2726 - 2735
IEEE Electron Device Letters > 2010 > 31 > 9 > 1032 - 1034
IEEE Transactions on Electron Devices > 2007 > 54 > 11 > 3064 - 3070