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IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2751 - 2757
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 12 > 3330 - 3338
IEEE Transactions on Nanotechnology > 2014 > 13 > 2 > 228 - 237
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.5.1 - EL.5.5
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3726 - 3733
Proceedings of the IEEE > 2013 > 101 > 7 > 1567 - 1584
IEEE Electron Device Letters > 2013 > 34 > 10 > 1340 - 1342
IEEE Electron Device Letters > 2012 > 33 > 11 > 1565 - 1567
IEEE Electron Device Letters > 2012 > 33 > 9 > 1234 - 1236
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 4049 - 4052
IEEE Transactions on Electron Devices > 2011 > 58 > 12 > 4377 - 4383
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1957 - 1962
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1388 - 1396
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 895 - 900
IEEE Electron Device Letters > 2011 > 32 > 8 > 1008 - 1010