Search results for: Keith A. Jenkins
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2016 - 2022
IEEE Electron Device Letters > 2015 > 36 > 12 > 1274 - 1276
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2148 - 2154
2015 IEEE International Reliability Physics Symposium > 2B.1.1 - 2B.1.6
2015 IEEE International Reliability Physics Symposium > 6A.2.1 - 6A.2.5
IEEE Journal of Solid-State Circuits > 2015 > 50 > 1 > 10 - 23
Microelectronics Reliability > 2014 > 54 > 11 > 2371-2377
2014 IEEE International Reliability Physics Symposium > 6B.3.1 - 6B.3.4
2013 IEEE International Electron Devices Meeting > 19.9.1 - 19.9.3
Microelectronics Reliability > 2013 > 53 > 9-11 > 1252-1256
IEEE Electron Device Letters > 2013 > 34 > 10 > 1340 - 1342
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2013 > 3 > 11 > 1917 - 1925
2011 International Electron Devices Meeting > 2.2.1 - 2.2.4
2011 International Electron Devices Meeting > 2.1.1 - 2.1.4