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In order to meet the demands for the high-density, high-performance, high-speed, smaller form factor and multi-function integration in portable electronic products, novel packaging technology now trends toward system in package (SiP) technology. 3D packaging technology is one of the most optimum means to achieve SiP. The embedded technology is one of the 3D packaging solutions and playing a key role...
The fabrication of embedded passives represents a promising solution for system in package (SiP) regarding the reduction of size and assembly costs. But the thermo-mechanical deformation caused by residual stress generated from embedded passives processing have a significant impact on reliability of embedded passives. Due to the complication of embedded passives processing, there are several challenges...
Due to the increase of microelectronic assemblies' complexity, the use of FEM simulations has become inescapable either for reliability prediction, or for virtual prototyping or qualification. This article will first describe the main reliability challenges linked to harsher environmental stresses, to new materials, to third dimension. Some examples taken from the current IMS lab studies, will illustrate...
System in Package(SiP) includes technologies of Multi-chip Module(MCM), Multi-chip Package(MCP), stacked die, Package on Package(PoP), Package in Package(PiP) and Embedded substrate. While Au wire bonding technology is commonly used as current SIP interconnection solution, take Staked Die structure for example, with increasing stack die number the upper die needs longer wire bonding length for signal...
With the development trend of microelectronic system with small size, high speed, high frequency and high density, passive and active components are directly embedded into a core or high-density-interconnect layers. This System-in-Package (SiP) technology could shorten interconnection between the die and substrate and reduce the inductance and noise interference. However, there are many electrical...
Embedded passives represent a promising solution regarding the reduction of size and assembly costs of system in package (SiP). In addition, the benefits also include improvements in electrical performance and reliability. Although embedded passives are more reliable by elimination solder joint interconnects, they also introduce other concerns such as deformation and component instability. More layers...
In this study, three examples of failure analyses of electronic packaging by using the finite element method are presented. These are: (1) the failures (delaminations) near the interface between the filled copper and the silicon and between the copper and the silicon dioxide dielectric of the TSV of a 3D system-in-package (SiP) due to the local thermal expansion mismatch between the silicon and the...
Recently, drop test reliability has become a major concern for mobile electronic products. Especially, system-in-package (SIP) like stacked-die-package and package-on-package may lead to increased stress in solder joints during drop impacts due to their complicate structures. In this study, the evaluation of drop test reliability was performed for SIPs using modeling and drop test. 3D-dynamic nonlinear...
With the increased complexity of SiP (system in package), Finite Element simulations take an important role in predicting the thermo-mechanical package reliability. Failures in flip chip packages such as die cracking and fatigue of solder bumps are specially the result of the mismatch in thermal expansion coefficients between die and the substrate. In some packages, we use an underfill to improve...
The drop reliability of mobile electronic products has become a major concern recently. Especially, system-in-package (SIP) like stacked-die-package and package-on-package may lead to increased the stress during drop impact due to their complicate structure. In this study, evaluation and prediction of the drop reliability for SIP was performed using modeling techniques. 3D-dynamic nonlinear finite...
The system-in-package (SiP) is among the popular designs which meet the trend of integrated circuit (IC) development. The SiP structure investigated in this study includes seven sub-chips attached to the chip carrier, and polymer was applied around the chips. The polymer is an exceptional stress buffer layer reducing the maximum shear stress in the solder joints, but it also affects the copper interconnection...
The system-in-package (SiP) is one of the popular designs to meet the trend of integrated circuit (IC) development. It is known for its small size, light weight, and multiple functionality. In this paper, a radio frequency front end module (RF-FEM) incorporated with the novel wafer-level chip scale package (WLCSP) technology is investigated. Generally the solder joints in WLCSP are the weakest portions...
A computational modelling approach integrated with optimisation and statistical methods that can aid the development of reliable and robust electronic packages and systems is presented. The design for reliability methodology is demonstrated for the design of a SiP structure. In this study the focus is on the procedure for representing the uncertainties in the package design parameters, their impact...
Design for manufacture of system-in-package (SiP) structures is dependent on a number of physical processes that affect the final quality of the package in terms of its performance and reliability. Solder joints are key structures in a SiP and their behavior can be the critical factor in terms of reliability. This paper discusses the results from a research programme on design for manufacturing of...
Usually the mechanical reliability of electronic packages is qualified by temperature cycle tests (TCT). However this is a more or less isothermal test, while in operating condition temperatures can have a non-uniform distribution, because thermal transient effects are present. This effect can play an important role in packages that generate heat, like the module with power amplifier that we studied...
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