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In this paper, a functional principle for a broadband thermal detector suited for a monolithical integration is shown. Two tantalum load resistors are heated by an input signal, while the temperature at a fixed distance is recorded on chip with a differential temperature sensing bridge. An integrated differential to single-ended stage amplifies the bridges differential voltage and provides an output...
Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. To tackle with these issues and to have a better power management, power supply monitors are necessary. Traditional approaches use an external reference or are very sensitive to temperature and process...
Silicon photo-multiplier (SiPM) gain drifts due to temperature variations and this issue can be a source of relevant errors, for instance when the application requires high accuracy in the evaluation of the photopeak position, especially at low signal levels. In this paper we describe a compensation system that exploits a SiPM as temperature sensor and is able to keep the detector gain constant by...
In order to achieve online testing the syrup concentration in the process of boiling sugar, the syrup concentration detector was designed by taking the ADuC812 chip as the microprocessor; the radio frequency and PLL technology were used in it. These had achieved real-time monitoring the syrup concentration. At the same time, taking into account the impact of temperature on the syrup concentration,...
A possible technique to determine EMC safety distance of electro-initiated devices (EID) is the use of fiber-optic temperature sensors which are thermocoupled to the EID bridgewire [1]. Despite of excellent measurement properties, e.g. temperature range (typ. -100°C - 300°C) and temperature resolution (typ. 0.1°C) [2] theirs basic disadvantage is the limited speed of about 1 ms measurement rate. Therefore,...
In experiments at Large Hadron Collider detectors and electronics will be exposed to high fluxes of photons, charged particles and neutrons. Damage caused by the radiation will influence performance of detectors. It will therefore be important to continuously monitor the radiation dose in order to follow the level of degradation of detectors and electronics and to correctly predict future radiation...
Timing-error detection and recovery circuits are implemented in a 65 nm resilient circuit test-chip to eliminate the clock frequency guardband from dynamic supply voltage (VCC) and temperature variations as well as to exploit path-activation probabilities for maximizing throughput. Two error-detection sequential (EDS) circuits are introduced to preserve the timing-error detection capability of previous...
A high bandwidth critical path monitor (1 sample/ cycle at 4-5 GHz) capable of providing real-time timing margin information to a variable voltage/frequency scaling control loop is described. The critical path monitor tracks the critical path delay to within 1 FO2 inverter delay with a standard deviation less than 3 FO2 delays over process, voltage, temperature, and workload. The CPM is sensitive...
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