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IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3316 - 3323
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 953 - 956
IEEE Electron Device Letters > 2014 > 35 > 3 > 309 - 311
IEEE Electron Device Letters > 2013 > 34 > 11 > 1358 - 1360
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Electron Device Letters > 2011 > 32 > 3 > 255 - 257
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
2010 International Electron Devices Meeting > 34.2.1 - 34.2.4
2010 IEEE International Reliability Physics Symposium > 1082 - 1085