Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4065 - 4070
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3528 - 3533
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-2.1 - 4B-2.10
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 617 - 621
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4218 - 4225
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1696 - 1703
IEEE Transactions on Biomedical Circuits and Systems > 2016 > 10 > 1 > 163 - 174
2015 IEEE International Electron Devices Meeting (IEDM) > 16.1.1 - 16.1.4
IEEE Transactions on Nanotechnology > 2015 > 14 > 5 > 847 - 853
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1226 - 1232
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1235 - 1240
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 3978 - 3984