Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5154 - 5161
IEEE Electron Device Letters > 2017 > 38 > 12 > 1680 - 1683
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 667 - 671
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-1 > 4851 - 4860
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4664 - 4670
IEEE Sensors Journal > 2017 > 17 > 20 > 6682 - 6689
2017 IEEE SENSORS > 1 - 3
2017 IEEE SENSORS > 1 - 3
2017 IEEE SENSORS > 1 - 2
2017 IEEE SENSORS > 1 - 3
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2856 - 2866
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3528 - 3533
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 9 > 797 - 799
IEEE Transactions on Nanotechnology > 2017 > 16 > 5 > 826 - 831