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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
2015 IEEE International Electron Devices Meeting (IEDM) > 20.3.1 - 20.3.4
2015 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.4
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 114 - 120
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2113 - 2118
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 515 - 523
IEEE Electron Device Letters > 2013 > 34 > 10 > 1289 - 1291
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.1.1 - 5A.1.6
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2173 - 2179
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1476 - 1482
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1170 - 1175
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2061 - 2071
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4