Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 85 - 94
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 11 - 18
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4599 - 4606
IEEE Transactions on Nanotechnology > 2017 > 16 > 5 > 868 - 875
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3511 - 3514
IEEE Sensors Journal > 2017 > 17 > 15 > 4853 - 4861
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2248 - 2257
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1007 - 1014
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 66 - 72
IEEE Access > 2017 > 5 > 18918 - 18926
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 3 - 10
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3857 - 3863
IEEE Electron Device Letters > 2016 > 37 > 8 > 1051 - 1054
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2306 - 2312
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2176 - 2181
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1658 - 1665
IEEE Transactions on Nanotechnology > 2016 > 15 > 1 > 2 - 14
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3588 - 3594
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3117 - 3124
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2745 - 2750