Search results
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3588 - 3594
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 122 - 134
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 16 - 22
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 1161 - 1167
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 444 - 455
IEEE Electron Device Letters > 2012 > 33 > 8 > 1117 - 1119
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1635 - 1642
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1798 - 1803
IEEE Electron Device Letters > 2011 > 32 > 3 > 255 - 257
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2697 - 2703
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1889 - 1894
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1597 - 1607
IEEE Electron Device Letters > 2010 > 31 > 9 > 1029 - 1031
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2107 - 2113
IEEE Transactions on Nuclear Science > 2008 > 55 > 1-3 > 662 - 666
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 872 - 880
IEEE Electron Device Letters > 2008 > 29 > 9 > 1056 - 1058
IEEE Electron Device Letters > 2007 > 28 > 12 > 1114 - 1116
IEEE Electron Device Letters > 2007 > 28 > 11 > 987 - 989