The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In-place Polarity inVersion (IPV) has been proposed to mitigate the single event upset (SEU) induced soft errors for academic VPR FPGA architectures, and this paper extends the original IPV so that it can be used for commercial FPGA architectures. Different from the original IPV, we use a new soft error model based on signal probability and propose a simple yet effective greedy based algorithm. To...
Analytical method is becoming a novel and attractive method to evaluate the Single Event Effect (SEE) performance of the circuit implemented in SRAM-based FPGA. A SEE vulnerability analysis model of FPGA circuit is proposed, which describes the function between the soft failure rate and the SEE vulnerability bit of FPGA circuit. The analysis methodology of SEE vulnerability bit of switch matrix is...
Soft error induced reliability problem has already become a major concern for modern SRAM-based FPGAs (Field Programmable Gate Arrays) even at the ground level. In this paper, we propose a duplication-with-recovery (DWR) technique to recover the configuration bit faults on interconnects, which contribute to the majority of soft errors in FPGAs. Based on a study on the detailed routing structure in...
FPGA is widely used in military and aerospace applications and FPGA testing is the most effective means to ensure the reliability of them. Interconnect Resources testing is one of the most important parts of FPGA testing since that most of the faults occur on Interconnect Resources. FPGA needs to be configured as specified circuits before being tested and conventional HDL-based configuration can not...
The reduction in the transistor and interconnect dimensions have a severe impact on the reliable performance of the Field Programmable Gate Array (FPGA) circuits. The process variation effects in nanometer scale technologies result in transient errors or permanent failures that cause undesired behavior of the circuit. In this work, we analyze a method for fault identification to mitigate the impact...
3-D integration has been touted as an approach to reducing the lengths of critical paths in field-programmable gate arrays (FPGAs). A 3-D chip stacks a number of 2-D FPGA bare dies, interconnected by through-silicon vias (TSVs) and micro bumps, to attain a high packing density. However, the technology also introduces new types of defects, such as TSV void and microbump misalignment. Testing the interconnection...
Packet-based on-chip interconnection networks, or Network-on-Chips (NoCs) are progressively replacing global on-chip interconnections in Multi-processor System-on-Chips (MP-SoCs) thanks to better performances and lower power consumption. However, modern generations of MP-SoCs have an increasing sensitivity to faults due to the progressive shrinking technology. Consequently, in order to evaluate the...
This paper presents a new fine-grain diagnostics technique that is able to locate multiple interconnect faults of an FPGA. The proposed methodology uses the concept of remove, reroute and replace technique to automatically diagnose the precise location of the faulty interconnect resources and to self-repair them. In this technique, the net under test (NUT) is removed completely and rerouted using...
Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strategy of SRAM-based field programmable gate arrays (FPGA). Programmable switches (PSs) and line segments are tested separately, which is different from previous methods. An improved depth-first-search (DFS) algorithm is developed for automatically deriving minimal or near minimal test configuration patterns...
Due to their reconfigurability and their high density of resources, SRAM-based FPGAs are more and more used in embedded systems. For some applications (Pay-TV,Banking, Telecommunication ...), a high level of security is needed. FPGAs are intrinsically sensitive to ionizing effects, such as light stimulation, and attackers can try to exploit faults injected in the downloaded configuration. Previous...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.