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Using more and more sensors, an increase in complexity and quantity of wiring is the consequence. This can be solved by using wireless sensors which are powered by energy harvesting. For this purpose, thermal energy harvesting by using atmospheric temperature variations is investigated by using a test setup in a climate cabin with a 65 minutes temperature cycle with minimum temperature of −40°C for...
This paper presents a circuitry for physically unclonable function, generating a unique and stable key for security-oriented applications. The key is generated from an array of pairs of voltage-compensated proportional-to-absolute-temperature generators. The difference between two analog outputs of a pair is voltage- and temperature-compensated yet sensitive mostly only to random threshold-voltage...
When testing printed circuit boards in-situ in a test cabinet with a wireless connection, it is very hard to store the necessary energy, especially in a high temperature environment. With a thermoelectric generator (TEG) as an independent energy source in a climate test cabinet, the battery or the external power cable connections for the device under test (DUT) can be omitted. In this paper, we investigate...
This paper presents an all-CMOS temperature sensor front-end operating at low supply voltage. The front-end includes a reference voltage generator and a proportional-to-absolute-temperature (PTAT) voltage generator. In order to minimize the errors due to various mismatches, error correction techniques including gain boosting, dynamic element matching, dynamic offset cancellation and clock boosting...
Power and thermal considerations are becoming limiting factors for submicron circuits as technology scales down. In order to detect abnormal temperature changes so as to detect defects on chip, and increase reliability and service life of devices, an all CMOS temperature sensor for submicron circuits' test is proposed. A current proportion to absolute temperature is generated for achieving linear...
Timing-error detection and recovery circuits are implemented in a 65 nm resilient circuit test-chip to eliminate the clock frequency guardband from dynamic supply voltage (VCC) and temperature variations as well as to exploit path-activation probabilities for maximizing throughput. Two error-detection sequential (EDS) circuits are introduced to preserve the timing-error detection capability of previous...
A high bandwidth critical path monitor (1 sample/ cycle at 4-5 GHz) capable of providing real-time timing margin information to a variable voltage/frequency scaling control loop is described. The critical path monitor tracks the critical path delay to within 1 FO2 inverter delay with a standard deviation less than 3 FO2 delays over process, voltage, temperature, and workload. The CPM is sensitive...
In this study, we fabricated in-plane thermoelectric micro-generators (4 mm times 4 mm) based on bismuth telluride thin films by using flash evaporation method. The thermoelectric properties of as-grown thin films are lower than those of bulk materials. Therefore the as-grown thin films were annealed in hydrogen at atmospheric pressure for 1 hour in a temperature range of 200 degC. to 400degC. By...
Thick film resistance and capacitance elements have recently come to be used in miniaturized and lightweight electronic instruments. The thick-film magnetic semiconductor (IMS), with a thickness of 80 ??m, is a sintered substance based on ferrite powder and a ruthenium compound. The TMS has both the ferromagnetic and the semiconducting properties of the ferrite and the ruthenium compound. The TMS...
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