Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Industrial Electronics > 2017 > 64 > 11 > 9012 - 9022
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-2.1 - 3B-2.8
IEEE Electron Device Letters > 2017 > 38 > 4 > 505 - 508
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 2 > 211 - 219
2015 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.8
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 69 - 74
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 437 - 444