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Resistive dividers for wideband power analyzers have been designed. They have been built with identical resistors connected in series and parallel in a quasi-coaxial structure. Simulations on the PSpice models, the methods developed for their calibration and the preliminary experiments show that the accuracy for frequency up to 20 kHz can be better than 30 parts in 106 for the ratio and 20 µrad for...
Possibility of complex resistance parameter measurement within a frequency range by the method of coordinate system displacement on current components is investigated.
This paper presents a methodology for determining the series resistance of (through-wafer interconnect) Vias directly from measured S-Parameters using an ultra-low impedance measurement known as the “S21-Shunt” technique. Data is acquired following on-wafer SOLT calibration using standard VNA / PNA hardware by characterizing “series-shunt” configured test structures. Measurement errors attributable...
This paper describes a measuring set up based on a synchronous sampling system which allows the calibration of any kind of impedance (resistance, inductance or capacitance) in terms of a reference resistance standard. The impedance range covered starts below 1 Ω and reaches 100 kΩ for frequencies ranging between 50 Hz and 20 kHz.
Tower Type Sensor (TTS) system was developed to monitor depth-related electrical resistivity in chloride-contaminated concrete. The AC impedance method was adopted to measure the electrical resistivity of concrete. This paper also details arrangements of TTS and its calibration approach. Then the sensor geometric constant k was determined by 0.01 mol/L KCl solution. In view of the RC circuit characteristics...
A universal resistance-to-digital converter based on the universal sensors and transducers interfacing integrated circuit (USTI) investigated and described at the first time. A three-point calibration technique for accurate resistance measurements in a wide resistive range has been implemented in a single integrated circuit that allows a direct resistance-to-digital conversion according to three popular...
mm-Wave applications claim for accurate and reliable device models for their very high frequency operation range. This is not possible without any representative measurement of the intrinsic device performances especially HF small-signal measurements. In this paper we determine major parasitic contributions of regular HF test structures. Parasitic investigation goes from the probes down to the transistor...
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