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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5217 - 5222
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
2016 IEEE International Electron Devices Meeting (IEDM) > 33.6.1 - 33.6.4
2013 5th IEEE International Memory Workshop > 159 - 162
2012 International Electron Devices Meeting > 30.3.1 - 30.3.4
2012 International Electron Devices Meeting > 16.6.1 - 16.6.4
IEEE Electron Device Letters > 2012 > 33 > 10 > 1453 - 1455
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 700 - 704
IEEE Electron Device Letters > 2011 > 32 > 10 > 1322 - 1324
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1883 - 1888