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IEEE Electron Device Letters > 2017 > 38 > 8 > 1165 - 1167
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2054 - 2060
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2072 - 2079
2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-4.1 - 5C-4.7
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4