Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3511 - 3514
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 384 - 391
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 455 - 462
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 631 - 637
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2299 - 2305
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2190 - 2196
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 966 - 973
IEEE Electron Device Letters > 2015 > 36 > 10 > 1094 - 1096
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 3019 - 3024
IEEE Electron Device Letters > 2015 > 36 > 7 > 726 - 728
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1848 - 1854
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3705 - 3709