Szukanie zaawansowane
Szukanie zaawansowane w ludziach
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 3099 - 3112
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3132 - 3138
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-5.1 - DG-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-1.1 - DG-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-9.1 - DG-9.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 5B-2.1 - 5B-2.5
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3944 - 3949
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2268 - 2274
IEEE Electron Device Letters > 2016 > 37 > 5 > 611 - 614
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-5-1 - CD-5-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-4-1 - 7A-4-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-6-1 - 4A-6-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-2-1 - 7A-2-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-3-1 - 7A-3-5
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 308 - 318
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6