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IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2505 - 2511
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2093 - 2099
IEEE Electron Device Letters > 2012 > 33 > 4 > 486 - 488
2011 International Reliability Physics Symposium > XT.7.1 - XT.7.2