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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 3A-5-1 - 3A-5-8
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 298 - 307
IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
2015 IEEE International Reliability Physics Symposium > MY.4.1 - MY.4.6
2015 IEEE International Reliability Physics Symposium > 2A.4.1 - 2A.4.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.2.1 - 3A.2.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.3.1 - 3A.3.9
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 3 > 855 - 864
IEEE Electron Device Letters > 2012 > 33 > 4 > 597 - 599
IEEE Transactions on Dielectrics and Electrical Insulation > 2010 > 17 > 5 > 1364 - 1372