Advanced search
Advanced search in people
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 128 - 134
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 620 - 626
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 47 - 61
IEEE Electron Device Letters > 2008 > 29 > 5 > 483 - 486