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2011 International Reliability Physics Symposium > XT.2.1 - XT.2.2
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
Ieee transactions on components and packaging technologies > 2009 > 32 > 4 > 838 - 848
IEEE Electron Device Letters > 2008 > 29 > 5 > 483 - 486