Advanced search
Advanced search in people
IEEE Electron Device Letters > 2018 > 39 > 1 > 103 - 106
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3762 - 3767
IEEE Electron Device Letters > 2017 > 38 > 8 > 1067 - 1070
IEEE Electron Device Letters > 2017 > 38 > 7 > 910 - 913
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2587 - 2591
IEEE Electron Device Letters > 2017 > 38 > 6 > 752 - 755
IEEE Electron Device Letters > 2017 > 38 > 4 > 513 - 516