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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 182 - 195
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 122 - 128
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3473 - 3483
IEEE Transactions on Reliability > 2017 > 66 > 4 > 966 - 979
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3341 - 3354
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4486 - 4491
IEEE Electron Device Letters > 2017 > 38 > 11 > 1532 - 1535
TENCON 2017 - 2017 IEEE Region 10 Conference > 2576 - 2581