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IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2592 - 2598
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-3.1 - CR-3.6
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 153 - 158
IEEE Electron Device Letters > 2016 > 37 > 4 > 412 - 415
2015 IEEE International Electron Devices Meeting (IEDM) > 25.8.1 - 25.8.4
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 3004 - 3011
IEEE Electron Device Letters > 2015 > 36 > 2 > 144 - 146
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3632 - 3638
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1561 - 1566
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 245 - 251
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 109 - 116
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.7.1 - XT.7.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1476 - 1482
IEEE Electron Device Letters > 2011 > 32 > 3 > 321 - 323