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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 404 - 413
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 10 > 1618 - 1629
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4038 - 4045
2015 IEEE International Reliability Physics Symposium > 3B.4.1 - 3B.4.8
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 8 > 1705 - 1715
IEEE Electron Device Letters > 2014 > 35 > 9 > 951 - 953
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3206 - 3212
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 4 > 249 - 253
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 2143 - 2147
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 9 > 1645 - 1655
IEEE Electron Device Letters > 2012 > 33 > 2 > 137 - 139
IEEE Electron Device Letters > 2012 > 33 > 3 > 303 - 305
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Dependable and Secure Computing > 2011 > 8 > 5 > 756 - 769
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 805 - 811
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3506 - 3513