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IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 6 - 13
IEEE Electron Device Letters > 2008 > 29 > 2 > 165 - 167
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 6 - 13
IEEE Electron Device Letters > 2008 > 29 > 2 > 165 - 167
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790