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IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 909 - 915
IEEE Electron Device Letters > 2016 > 37 > 7 > 843 - 846
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-5-1 - XT-5-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 2A-3-1 - 2A-3-7
2015 IEEE International Electron Devices Meeting (IEDM) > 11.6.1 - 11.6.4
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3595 - 3604
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3516 - 3523
IEEE Transactions on Nuclear Science > 2015 > 62 > 2 > 487 - 493
2015 IEEE International Reliability Physics Symposium > 2B.1.1 - 2B.1.6
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 795 - 801
IEEE Transactions on Circuits and Systems II: Express Briefs > 2014 > 61 > 5 > 344 - 348
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3152 - 3158
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1327 - 1334
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.5