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2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2016 IEEE International Electron Devices Meeting (IEDM) > 31.8.1 - 31.8.4
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1808 - 1813
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 103 - 114
IEEE Electron Device Letters > 2015 > 36 > 2 > 105 - 107
IEEE Electron Device Letters > 2014 > 35 > 6 > 639 - 641
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 359 - 364
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4079 - 4084
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 92 - 96
2012 International Electron Devices Meeting > 16.6.1 - 16.6.4
IEEE Electron Device Letters > 2012 > 33 > 10 > 1453 - 1455
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1822 - 1829
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 80 - 86
IEEE Electron Device Letters > 2011 > 32 > 5 > 614 - 616
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2911 - 2916