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IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3324 - 3330
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 513 - 516
2016 IEEE International Electron Devices Meeting (IEDM) > 33.6.1 - 33.6.4
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4233 - 4239
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
2015 IEEE International Electron Devices Meeting (IEDM) > 21.8.1 - 21.8.4
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1419 - 1426
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2767 - 2773
IEEE Electron Device Letters > 2014 > 35 > 9 > 894 - 896
2012 International Electron Devices Meeting > 16.6.1 - 16.6.4
IEEE Electron Device Letters > 2012 > 33 > 10 > 1453 - 1455
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1822 - 1829
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2961 - 2967
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 80 - 86
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 419 - 426