The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper dealt with the following topics: systems-on-a-chip; multiprocessor; system synthesis; circuit design; fault tolerance; digital system design; arithmetic circuit synthesis; system-level energy optimization; HW-SW embedded systems; flexible digital radio; programmable-re-configurable architectures; embedded-digital system applications; digital system testing; logic synthesis; wireless sensor...
Several regular parallel trees have been proposed over the years to optimize logic depth, area, fan-out and interconnect count for logic circuits. In this paper, we propose a comparative study of different parallel prefix trees used in the design of a new end-around carry (EAC) adder targeting FPGA technology. This new adder is based on the fast 128-bit binary floating-point EAC adder which has been...
This paper presents the design of a highly efficient CMOS 2-input NAND (gcr-nand). When implemented on a 65 nm CMOS technology, under 1 pF capacitive loading condition, gcr-nand has a lower active area (3.4 times lower), and energy-delay product (56%) than the reference 2-input NAND (lscpl-nand). Furthermore, gcr-nand is able to operate under a high output load.
Predictions for the properties of integrated circuits and systems fabricated in emerging nanotechnologies indicate a rising level of static and dynamic faults due to new fault mechanisms. Not only transient faults due to particle radiation are becoming a problem, but also wear-out effects on transistors and interconnects. While transient faults can be covered by well-known technologies such as error-correcting...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.