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The design space of integrated circuits grows due to the need of fault recognition and error compensation. To meet reliability requirements, several reliability increasing methods have to be evaluated. We present a reliability estimation process which allows estimating the resulting reliability of a modified circuit without the need of synthesis. For further speed up, synthesis results after choosing...
Predictions for the properties of integrated circuits and systems fabricated in emerging nanotechnologies indicate a rising level of static and dynamic faults due to new fault mechanisms. Not only transient faults due to particle radiation are becoming a problem, but also wear-out effects on transistors and interconnects. While transient faults can be covered by well-known technologies such as error-correcting...
Technology forecasts concerning the development of CMOS technologies predict a higher level of intermittent faults due to radiation effects, but also a higher density of permanent fault effects due to inevitable parameter shifts and higher stress factors. For high production yield and long-term dependable operation, mechanisms of built-in self repair that can be used after production test and in the...
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