IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 647 - 651
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 135 - 144
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 147 - 162
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 180 - 189
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 163 - 170
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 483 - 488
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 392 - 402
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 82 - 86
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 87 - 91
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 366 - 373
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 263 - 272
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 248 - 253
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 316 - 322
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 310 - 315
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 73 - 80
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 177 - 184
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 154 - 160
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 382 - 389
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 769 - 771