IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4850 - 4855
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4861 - 4867
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4919 - 4927
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4856 - 4860
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4965 - 4973
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5012 - 5018
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5279 - 5283
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5128 - 5133
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5242 - 5248
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5147 - 5150
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4831 - 4837
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4992 - 5000
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4937 - 4945
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5263 - 5269
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5249 - 5255
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4928 - 4936
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5151 - 5156
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5006 - 5011